N.Z. Haron, M.M. Ibrahim, S.A.M. Junos@Yunus, and A.S.A. Aziz (Malaysia)
Built-in self test (BIST), Very High Speed Integrated Circuit Hardware Description Language (VHDL), field programmable logic array (FPGA), microcode-based and FSM-based.
This paper presents the design and implementation of a microcode-based and an FSM-based memory built-in self test (BIST) controllers using Xilinx Spartan XC3S500E FPGA. The controllers are written in Very High Speed Integrated Circuit Hardware Description Language (VHDL) code and verified using Xilinx ISE design tools. Synthesis and implementation on the field programmable logic array (FPGA) device when testing several memory sizes are carried out based on March C-, March C and March X, MATS+ and MATS test pattern algorithms. Logic area utilization and flexibility of the two controllers are evaluated. We show that the microcode-based controller has better flexibility but occupies larger logic area compared to the FSM-based controller.
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